Atomic force microscopy (AFM) is a powerful method for real-space imaging of surfaces with atomic resolution. Several different modes of operation have been developed, dedicated to meet the specific requirements of the given scientific question. In this lecture, the different operation modes will be introduced and discussed in the view of which physical quantity is probed. The three AFM equations will be derived, which provide the basis for obtaining quantitative information within the harmonic approximation.
Frequency | Weekday | Time | Format / Place | Period |
---|
Module | Course | Requirements | |
---|---|---|---|
21-MA-CM-10LP Ergänzungsmodul Master Chemie/ Biochemie | 2 Std. Vorlesung 1 | Ungraded examination
|
Student information |
21-MA-CM-5LP Ergänzungsmodul Master Chemie/ Biochemie | 2 Std. Vorlesung 1 | Ungraded examination
|
Student information |
The binding module descriptions contain further information, including specifications on the "types of assignments" students need to complete. In cases where a module description mentions more than one kind of assignment, the respective member of the teaching staff will decide which task(s) they assign the students.