Atomic force microscopy (AFM) is a powerful method for real-space imaging of surfaces with atomic resolution. Several different modes of operation have been developed, dedicated to meet the specific requirements of the given scientific question. In this lecture, the different operation modes will be introduced and discussed in the view of which physical quantity is probed. The three AFM equations will be derived, which provide the basis for obtaining quantitative information within the harmonic approximation.
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21-MA-CM-10LP Ergänzungsmodul Master Chemie/ Biochemie | 2 Std. Vorlesung 1 | unbenotete Prüfungsleistung
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Studieninformation |
21-MA-CM-5LP Ergänzungsmodul Master Chemie/ Biochemie | 2 Std. Vorlesung 1 | unbenotete Prüfungsleistung
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Studieninformation |
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